1.
Conformance Test Architecture and Test Suite for ANSI/NIST-ITL 1-2011 NIEM XML Encoded Trans...
by Fernando L Podio, Dylan Yag...
ISBN: 9781500312961
List Price: $16.99
2.
Recent Advances in Metrology, Characterization, and Standards for Optical Digital Data Disks...
by Podio, Fernando L., Society...
ISBN: 9780819432926
List Price: $80.00