Showing 1 - 2 of 2 Results
1.
Conformance Test Architecture and Test Suite for ANSI/NIST-ITL 1-2011 NIEM XML Encoded Trans... by Fernando L Podio, Dylan Yag... ISBN: 9781500312961 List Price: $16.99
2.
Recent Advances in Metrology, Characterization, and Standards for Optical Digital Data Disks... by Podio, Fernando L., Society... ISBN: 9780819432926 List Price: $80.00